Articles

Thought leadership articles by IABM and our members
Articles taken from IABM's journal and at show papers
To submit your article email marketing@theiabm.org

PHABRIX Whitepaper: Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces

Fri 25, 01 2019

Introduction

In this whitepaper, PHABRIX discusses the use of pseudo-random binary sequences (PRBS – also referred to as pseudo-random bit sequences), along with bit-error rate tests (BERT – also referred to as bit-error ratio tests) to stress test serial digital interfaces. The purpose of any physical layer serial digital interface (PHY) is to transmit or receive data whilst preserving that data’s integrity. In practical systems the major cause of bit-errors is random noise. To stress test such systems, it is necessary to both generate a “noisy” bit stream and then analyze the output from the interface to determine the bit-error rate which represents the integrity of the data.

To view the full whitepaper, click the button below

VIEW WHITEPAPER

Related Content

Based on your recent activity and preferences we recommend the following pieces of content