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PHABRIX Whitepaper: Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces

Fri 25, 01 2019


In this whitepaper, PHABRIX discusses the use of pseudo-random binary sequences (PRBS – also referred to as pseudo-random bit sequences), along with bit-error rate tests (BERT – also referred to as bit-error ratio tests) to stress test serial digital interfaces. The purpose of any physical layer serial digital interface (PHY) is to transmit or receive data whilst preserving that data’s integrity. In practical systems the major cause of bit-errors is random noise. To stress test such systems, it is necessary to both generate a “noisy” bit stream and then analyze the output from the interface to determine the bit-error rate which represents the integrity of the data.

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